[ACM TCPS 2025] Accepted Paper: Graph Deviation Network for Anomaly Detection and Localization in Additive Manufacturing Systems

Our paper “Graph Deviation Network for Anomaly Detection and Localization in Additive Manufacturing Systems” has been accepted for publication in the ACM Transactions on Cyber-Physical Systems (ACM TCPS’25), 2025. Congratulations, Rozhin.

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Prof. Al Faruque is elevated to IEEE Fellow – IEEE Fellow Class of 2026 →